E-StoreScanning Tunneling microscopy
18 Jun 2007 11:38:31 IST
Scanning Tunneling microscopy
SCANNING TUNNELING MICROSCOPY
The scanning tunneling microscope (STM) is a non-optical microscope that scans an electrical probe over a surface to be imaged to detect a weak electric current flowing between the tip and the surface. The STM (not to be confused with the scanning electron microscope) was invented in 1981 by Gerd Binnig and Heinrich Rohrer of IBM's Zurich Lab in Switzerland. Although initially greeted with some skepticism by materials scientists, the invention garnered the two a Nobel Prize in Physics (1986). The STM allows scientists to visualize regions of high electron density and hence infer the position of individual atoms and molecules on the surface of a lattice. Previous methods required arduous study of diffraction patterns and required interpretation to obtain spatial lattice structures. The STM is capable of higher resolution than its somewhat newer cousin, the atomic force microscope (AFM). Both the STM and the AFM fall under the class of scanning probe microscopes.
The STM can obtain images of conductive surfaces at an atomic scale 2 × 10?10 m or 0.2 nanometer, and also can be used to manipulate individual atoms, trigger chemical reactions, or reversibly produce ions by removing or adding individual electrons from atoms or molecules
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SINDHURA KADIYALA
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18 Jun 2007 12:38:10 IST
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